Keil Logo

Application Note 326

Using X-CUBE-STL with Arm FuSa RTS

Diagnostic tests are commonly used in safety-related systems to detect random hardware failures during run-time. Device vendors and 3rd-parties provide safety-certified Self-Test Libraries (STLs) that help developers execute required diagnostic tests in the application. In addition to fulfilling the safety requirements of an STL, the mutual interference between the STL and other software components needs to be analyzed.

This application note analyzes how a self-test library X-CUBE-STL from STMicroelectronics can be safely used in a FuSa RTS application. An example project is provided for the STM32F4 platform.

Application Note

APNT_326.PDF (926K)
Wednesday, May 13, 2020

Example Code

APNT_326.ZIP (31K)
Wednesday, May 13, 2020
  Arm logo
Important information

This site uses cookies to store information on your computer. By continuing to use our site, you consent to our cookies.

Change Settings

Privacy Policy Update

Arm’s Privacy Policy has been updated. By continuing to use our site, you consent to Arm’s Privacy Policy. Please review our Privacy Policy to learn more about our collection, use and transfers
of your data.